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Crystallization of Sio2-Tio2 Glassy Films Studied by Atomic Force Microscopy

AuthID
P-000-Z4N

Author(s)

Karthikeyan, A

Almeida, RM

Tipo de Documento

Article

Year published

2000

Publicado

in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093

Volume: 274, Número: 1-3, Páginas: 169-174 (6)

Conference

9Th International Conference on the Physics of Non-Crystalline Solids (Pns 1999), Date: OCT 17-21, 1999, Location: TUCSON, AZ, Patrocinadores: NASA, Div Micrograv Sci & Applicat, NSF, Div Mat Res, Guardian Ind Corp, Elsevier Ltd

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Publication Identifiers

DOI: 10.1016/s0022-3093(00)00212-x

SCOPUS: 2-s2.0-0034273272

Wos: WOS:000089298300025

Source Identifiers

ISSN: 0022-3093

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Crystallization of Sio2-Tio2 Glassy Films Studied by Atomic Force Microscopy

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Crystallization of Sio2-Tio2 Glassy Films Studied by Atomic Force Microscopy

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