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Vis/Nir Detector Based on Mu C-Si : H P-I-N Structures

AuthID
P-001-0HJ

Author(s)

Fernandes, M

Macarico, A

Tipo de Documento

Article

Year published

2000

Publicado

in THIN SOLID FILMS, ISSN: 0040-6090

Volume: 364, Número: 1-2, Páginas: 204-208 (5)

Conference

Symposium P: Optical Characterization of Semiconductor Layers and Surfaces at the 1999 E-Mrs Spring Conference, Date: JUN 01-04, 1999, Location: STRASBOURG, FRANCE

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Publication Identifiers

DOI: 10.1016/s0040-6090(99)00924-4

SCOPUS: 2-s2.0-0033902436

Wos: WOS:000086555400039

Source Identifiers

ISSN: 0040-6090

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Vis/Nir Detector Based on Mu C-Si : H P-I-N Structures

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