Measuring the Magnitude of Envelope Fluctuations: Should We Use the Papr?

AuthID
 P-00A-9M8
5
Author(s)
Bento, P
·
Tipo de Documento
Proceedings Paper
Year published
2014
Publicado
in 2014 IEEE 80TH VEHICULAR TECHNOLOGY CONFERENCE (VTC FALL), ISSN: 1550-2252
Conference
80Th Ieee Vehicular Technology Conference (Vtc Fall), Date: SEP 14-17, 2014, Location: Vancouver, CANADA, Patrocinadores: IEEE, TELUS, Huawei Technologies Co Ltd, Natl Instruments, IMST GmbH, FEKO, EM Software & Syst
Indexing
Wos®
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84919459119
Wos: WOS:000353345400253
Source Identifiers
ISSN: 1550-2252
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service