Publicações

Automated Evaluation of Patterned Fabrics for Defects Detection

AuthID
P-001-27V

Author(s)

Costa, MFM

Rodrigues, F

Guedes, J

Lopes, J

Editor(es)

SanchezMondragon, JJ

Tipo de Documento

Proceedings Paper

Year published

2000

Publicado

in SIXTH INTERNATIONAL CONFERENCE ON EDUCATION AND TRAINING IN OPTICS AND PHOTONICS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X

Volume: 3831, Páginas: 403-407 (5)

Conference

6Th International Conference on Education and Training in Optics and Photonics, Date: JUL 28-30, 1999, Location: CANCUN, MEXICO, Patrocinadores: Int Commiss Opt, Opt Soc Amer, SPIE, Univ Autonoma Estado Morelos, Mexico, Univ Guanajuato, Mexico, Acad Mexicana Optica, Secretaria Educ Publica, Consejo Nacl Cienca & Technol, Univ Amer Puebla, Inst Natl Astrofisica, Optica Electronica, Centro Investigaciones Opticas, CICESE, Univ Nacl Autonoma Medixo, Natl Sci Fdn

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