Metrological Quality of Measured and Evaluated Values Using Automated Measuring Systems

AuthID
P-001-2BV
1
Author(s)
2
Editor(es)
Hunter, J; Johnson, L
Tipo de Documento
Proceedings Paper
Year published
2000
Publicado
in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, ISSN: 0589-1485
Páginas: 604-605 (2)
Conference
Conference on Precision Electromagnetic Measurements (Cpem 2000), Date: MAY 14-19, 2000, Location: SYDNEY, AUSTRALIA, Patrocinadores: Int Bur Weights & Measures, IEEE Instrumentat & Measurement Soc, Natl Inst Stand & Technol, Natl Res Council Canada, Union Radio Sci Int, CSIRO, Natl Measurement Lab, Natl Facil, Ind Sci Resources, Ind Res Ltd, Nat Assoc Testing Authorities, Stand Australia, Natl Stand Commiss, Joint Accreditat Syst Australia & New Zealand, Korea Res Inst Stand & Sci, Ctr Measurement Stand, ITRI, Fluke Corp, Int Union Pure & Appl Phys, Natl Conf Stand Labs, Oxford Instruments, Prema Prazisionselektron, Metrol Soc Australia, Texas Instruments, TransGrid
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0033696385
Wos: WOS:000089712400305
Source Identifiers
ISSN: 0589-1485
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