Field Emission Interferometry with the Scanning Tunneling Microscope

AuthID
P-001-4BC
8
Author(s)
Caamano, AJ
·
Custance, O
·
Mendez, J
·
Baro, AM
·
Veuillen, JY
·
Gomez Rodriguez, JM
·
Saenz, JJ
Tipo de Documento
Letter
Year published
1999
Publicado
in SURFACE SCIENCE, ISSN: 0039-6028
Volume: 426, Número: 1, Páginas: L420-L425 (6)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0032638703
Wos: WOS:000080249600003
Source Identifiers
ISSN: 0039-6028
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