Performance of Nio Spin-Valve Tape Heads for High Recording Densities

AuthID
 P-001-4KZ
3
Author(s)
Li, SX
·
Tipo de Documento
Article
Year published
1999
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 85, Número: 8, Páginas: 5849-5851 (3)
Conference
43Rd Annual Conference on Magnetism and Magnetic Materials, Date: NOV 09-12, 1998, Location: MIAMI, FL, Patrocinadores: Amer Inst Phys, IEEE Magnet Soc, Minerals Met Mat Soc, Amer Soc Testing & Mat, Amer Ceramic Soc, Amer Phys Soc, EMTEC Magnet GmbH, Fuji Photo Film Co Ltd, IBM, Imation, Sony corp, TDK Corp, Toda Kogyo Corp, ADE Technol Inc, digital Measurement Syst Div, Komag, MMC Technol Inc
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Publication Identifiers
SCOPUS: 2-s2.0-4143103790
Wos: WOS:000079853500185
Source Identifiers
ISSN: 0021-8979
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