Role of the Hot Wire Filament Temperature on the Structure and Morphology of the Nanocrystalline Silicon P-Doped Films

AuthID
P-001-4NB
4
Author(s)
Mendes, L
·
Tipo de Documento
Article
Year published
1999
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 144-45, Número: 0, Páginas: 690-696 (7)
Conference
14Th International Vacuum Congress/10Th International Conference on Solid Surfaces/5Th International Conference on Nanometre-Scale Science and Technology/10Th International Conference on Quantitative Surface Analysis, Date: AUG 31-SEP 04, 1998, Location: BIRMINGHAM, ENGLAND, Patrocinadores: British Vacuum Council, Inst Phys, Int Union Vacuum Sci Tech & Applicat
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0032647996
Wos: WOS:000080552300138
Source Identifiers
ISSN: 0169-4332
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