Crystalline Quality of Inxga1-Xn Samples Assessed by Sem, Raman and Pl

AuthID
 P-001-601
8
Author(s)
Seitz, R
·
Gaspar, C
·
Pereira, E
·
Heuken, M
·
Schoen, O
·
Protzmann, H
2
Editor(es)
Cullis, AG; Beanland, R
Tipo de Documento
Article
Year published
1999
Publicado
in MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS in INSTITUTE OF PHYSICS CONFERENCE SERIES, ISSN: 0951-3248
Número: 164, Páginas: 401-406 (6)
Conference
Conference on Microscopy of Semiconducting Materials, Date: MAR 22-25, 1999, Location: OXFORD, ENGLAND, Patrocinadores: Inst Phys, Electron Microscopy & Analy Grp, Royal Microscop Soc, Mat Res Soc, Hitachi Sci Instruments Ltd, JEOL (UK) Ltd, FEI Ltd, Host: UNIV OXFORD
Indexing
Wos®
Publication Identifiers
Wos: WOS:000166835300086
Source Identifiers
ISSN: 0951-3248
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