Rbs Lattice Site Location and Damage Recovery Studies in Gan

AuthID
 P-001-60X
7
Author(s)
DaSilva, MF
·
Soares, JC
·
Bartels, J
·
Vianden, R
·
Abernathy, CR
·
Pearton, SJ
Tipo de Documento
Article
Year published
1999
Publicado
in MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH, ISSN: 1092-5783
Volume: 4, Número: SUPPL. 1
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-3442895419
Wos: WOS:000079680200145
Source Identifiers
ISSN: 1092-5783
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