Microwave Reflectometry Diagnostic for Density Profile and Fluctuation Measurements on Asdex Upgrade

AuthID
 P-001-682
15
Author(s)
Kurzan, B
·
Suttrop, W
Tipo de Documento
Article
Year published
1999
Publicado
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 70, Número: 1, Páginas: 1072-1075 (4)
Conference
12Th Topical Conference on High-Temperature Plasma Diagnostics, Date: JUN 07-11, 1998, Location: PRINCETON, NJ, Patrocinadores: Amer Phys Soc, Off Def Programs, US Dept Energy, Off Fus Energy, Princeton Plasma Phys Lab
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Publication Identifiers
SCOPUS: 2-s2.0-0000088284
Wos: WOS:000078278900217
Source Identifiers
ISSN: 0034-6748
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