Structural Properties of Ge Nano-Crystals Embedded in Sio2 Films from X-Ray Diffraction and Raman Spectroscopy

AuthID
 P-001-6HB
4
Author(s)
Tipo de Documento
Article
Year published
1998
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 336, Número: 1-2, Páginas: 58-62 (5)
Conference
Symposium on Thin Films Epitaxial Growth and Nanostructures, at the E-Mrs Spring Meeting 1998, Date: JUN 16-19, 1998, Location: STRASBOURG, FRANCE, Patrocinadores: European MRS
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Publication Identifiers
SCOPUS: 2-s2.0-0032320954
Wos: WOS:000078141900014
Source Identifiers
ISSN: 0040-6090
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