A Comparison by Simulation and by Measurement of the Substrate Noise Generated by Cmos, Csl, and Cbl Digital Circuits

AuthID
 P-000-40M
2
Author(s)
Tipo de Documento
Article
Year published
2005
Publicado
in IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, ISSN: 1549-8328
Volume: 52, Número: 4, Páginas: 734-741 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-18144421551
Wos: WOS:000228228200006
Source Identifiers
ISSN: 1549-8328
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