Blue Emission in Mg Doped Gan Studied by Time Resolved Spectroscopy

AuthID
P-001-CAX
7
Author(s)
Seitz, R
·
Gaspar, C
·
Leroux, M
·
Beaumont, B
·
Gibart, P
2
Editor(s)
Davies, G; Nazare, MH
Document Type
Article
Year published
1997
Published
in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3 in MATERIALS SCIENCE FORUM, ISSN: 0255-5476
Volume: 258-2, Issue: PART 2, Pages: 1155-1160 (6)
Conference
19Th International Conference on Defects in Semiconductors (Icds-19), Date: JUL, 1997, Location: AVEIRO, PORTUGAL, Sponsors: European Union DG XII Sci Res & Dev, Fundacao Calouste Gulbenkian, Junta Nacl Investigacio Cient & Tecnol, USA Res Off, Trans Tech Publicat Ltd, USN Off Naval Res Grant
Indexing
Publication Identifiers
Scopus: 2-s2.0-0031360186
Wos: WOS:000072749500189
Source Identifiers
ISSN: 0255-5476
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