Study of the Sensitivity in an Automatic Capacitance Measurement System

AuthID
 P-001-CH3
2
Author(s)
daSilva, MF
·
1
Editor(es)
Anon
Tipo de Documento
Proceedings Paper
Year published
1997
Publicado
in IMTC/97 - IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE: SENSING, PROCESSING, NETWORKING, PROCEEDINGS VOLS 1 AND 2 in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 1, Páginas: 329-334 (6)
Conference
Ieee Instrumentation and Measurement Technology Conference - Sensing, Processing, Networking (Imtc/97), Date: MAY 18-22, 1997, Location: OTTAWA, CANADA, Patrocinadores: IEEE Instrumentat & Measurement Soc, IEEE Ottawa Sect
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0030647778
Wos: WOS:A1997BH95G00063
Source Identifiers
ISSN: 1091-5281
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