Publicações

Stress Analysis of Titanium Dioxide Films by Raman Scattering and X-Ray Diffraction Methods

AuthID
P-001-D0A

Author(s)

Meng, LJ

dosSantos, MP

Editor(es)

Gerberich,WW;Gao,HJ;Sundgren,JE;Baker,SP

Tipo de Documento

Proceedings Paper

Year published

1997

Publicado

in THIN FILMS: STRESSES AND MECHANICAL PROPERTIES VI in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, ISSN: 0272-9172

Volume: 436, Páginas: 523-528 (4)

Conference

Symposium on Thin Films - Stresses and Mechanical Properties Vi, at the 1996 Mrs Spring Meeting, Date: APR 08-12, 1996, Location: SAN FRANCISCO, CA, Patrocinadores: Mat Res Soc, Mat Test Syst Inc, Hysitron Inc, US DOE

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Metadata
Fontes

Publication Identifiers

DOI: 10.1557/proc-436-523

Wos: WOS:A1997BH29Z00081

Source Identifiers

ISSN: 0272-9172

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Stress Analysis of Titanium Dioxide Films by Raman Scattering and X-Ray Diffraction Methods

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