Analytical Characterization of Spm Impact on Xpm-Induced Degradation in Dispersion-Compensated Wdm Systems

AuthID
 P-000-4HP
2
Author(s)
Luis, RS
·
Tipo de Documento
Article
Year published
2005
Publicado
in JOURNAL OF LIGHTWAVE TECHNOLOGY, ISSN: 0733-8724
Volume: 23, Número: 3, Páginas: 1503-1513 (11)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-18144426416
Wos: WOS:000228304800065
Source Identifiers
ISSN: 0733-8724
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service