Defect Level Evaluation in an Ic Design Environment

AuthID
 P-001-DKB
6
Author(s)
deSousa, JT
·
Teixeira, JP
·
Marzocca, C
·
Corsi, F
·
Williams, TW
Tipo de Documento
Article
Year published
1996
Publicado
in IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, ISSN: 0278-0070
Volume: 15, Número: 10, Páginas: 1286-1293 (8)
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0030263876
Wos: WOS:A1996VR33700010
Source Identifiers
ISSN: 0278-0070
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service