S-D Electron Scattering as a Sensitive Probe to Study Fe/Cr Multilayer Structural Differences (Mbe/Sputtered Samples)

AuthID
P-001-EHQ
7
Author(s)
Colino, J
·
Schuller, Y
·
Schad, R
·
Bruynseraede, Y
1
Editor(es)
Booth J.G.
Tipo de Documento
Article
Year published
1996
Publicado
in JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, ISSN: 0304-8853
Volume: 156, Número: 1-3, Páginas: 399-401 (3)
Conference
2Nd International Symposium on Metallic Multilayers (Mml 95), Date: SEP 11-14, 1995, Location: CAMBRIDGE, ENGLAND, Host: CAVENDISH LAB
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0030124196
Wos: WOS:A1996UV35800166
Source Identifiers
ISSN: 0304-8853
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