Experimental X-Ray Peak-Shape Determination for a Si(Li) Detector

AuthID
P-001-EJB
3
Author(s)
Tipo de Documento
Article
Year published
1996
Publicado
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 109, Páginas: 129-133 (5)
Conference
Viith International Conference on Particle Induced X-Ray Emission and Its Analytical Applications, Date: MAY 26-30, 1995, Location: ABANO TERME, ITALY, Patrocinadores: Ist Nazl Fis Nucl, Italy, Univ Padova, Italy, Ruder Boskovic Inst, Croatia, Int Atom Energy Agcy, Austria
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-4243548623
Wos: WOS:A1996UV44400025
Source Identifiers
ISSN: 0168-583X
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