Photoconductive Analysis of Defect Density of Hydrogenated Amorphous Silicon During Room-Temperature Plasma Posthydrogenation, Light Soaking, and Thermal Annealing

AuthID
 P-001-EXB
5
Author(s)
Goncalves, M
·
Schotten, V
·
Tipo de Documento
Article
Year published
1996
Publicado
in PHYSICAL REVIEW B, ISSN: 1098-0121
Volume: 53, Número: 4, Páginas: 1886-1890 (5)
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Publication Identifiers
SCOPUS: 2-s2.0-3042922118
Wos: WOS:A1996TU73000031
Source Identifiers
ISSN: 1098-0121
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