Correlation Between Electrical-Optical and Structural Properties of Microcrystalline Silicon N Type Films

AuthID
P-001-EZ7
6
Author(s)
Macarico, A
·
Nunes, R
·
Bicho, A
·
5
Editor(es)
Hack, M; Schiff, EA; Wagner, S; Schropp, R; Matsuda, A
Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in AMORPHOUS SILICON TECHNOLOGY - 1996 in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, ISSN: 0272-9172
Volume: 420, Páginas: 807-812 (6)
Conference
14Th Symposium on Amorphous Silicon Technology, at the 1996 Mrs Spring Meeting, Date: APR 08-12, 1996, Location: SAN FRANCISCO, CA, Patrocinadores: Mat Res Soc
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0030409864
Wos: WOS:A1996BH07P00128
Source Identifiers
ISSN: 0272-9172
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