Publicações

Evaluation of I(Dd)/V-Out Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
P-001-F4V

Author(s)

daSilva, JM

Matos, JS

Tipo de Documento

Proceedings Paper

Year published

1996

Publicado

in EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS in EUROPEAN CONFERENCE ON DESIGN AUTOMATION, ISSN: 1066-1409

Páginas: 264-268 (5)

Conference

European Design and Test Conference, Date: MAR 11-14, 1996, Location: PARIS, FRANCE, Patrocinadores: IEEE, Comp Soc, European Design & Automat Assoc, TTTC, European Grp, DATC, European Grp, ACM SIGDA, European Commiss, ADFTT NIS, AEIA, Spain, AFCET, France, ATI, Spain, BULL, France, CLRC, UK, CNR, Italy, CSIC, Spain, Estonian Electr Soc, GI, Germany, HTE, Hungary, IEEE, Circuits & Syst Soc, IFIP, 10.2/10.5, ITG, Germany, KVIV, Belgium, MATE, Hungary, Polish Acad Sci, VDE, Germany

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