Characterization of the Density of States of Polymorphous Silicon Films Produced at 13.56 and 27.12 Mhz Using Cpm and Sclc Techniques

AuthID
 P-00F-H9C
7
Author(s)
Raniero, L
·
Zhang, S
·
Tipo de Documento
Proceedings Paper
Year published
2004
Publicado
in Journal of Non-Crystalline Solids, ISSN: 0022-3093
Volume: 338-340, Número: 1 SPEC. ISS., Páginas: 206-210
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Publication Identifiers
SCOPUS: 2-s2.0-2942558760
Source Identifiers
ISSN: 0022-3093
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