Probabilistic Testability Analysis and Dft Methods at Rtl

AuthID
 P-00F-HH3
4
Author(s)
Fernandas, JM
·
Santos, MB
·
Teixeira, JC
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in 2006 IEEE Design and Diagnostics of Electronic Circuits and systems
Volume: 2006, Páginas: 214-215
Conference
2006 Ieee Design and Diagnostics of Electronic Circuits and Systems, Date: 18 April 2006 through 21 April 2006, Location: Praque
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Publication Identifiers
SCOPUS: 2-s2.0-33847148458
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