Publicações

Fast Adc Testing by Repetitive Histogram Analysis

AuthID
P-00F-HPE

Author(s)

Serra, AC

Alegria, F

Michaeli, L

Michalko, P

Saliga, J

Tipo de Documento

Proceedings Paper

Year published

2006

Publicado

in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281

Páginas: 1633-1638

Conference

Imtc'06 - Ieee Instrumentation and Measurement Technology Conference, Date: 24 April 2006 through 27 April 2006, Location: Sorrento, Patrocinadores: IEEE Instrumentation and Measurement Society

Indexing

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Fontes

Publication Identifiers

DOI: 10.1109/imtc.2006.237120

SCOPUS: 2-s2.0-36048965820

Source Identifiers

ISSN: 1091-5281

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Info

At this moment we don't have any links to full text documens.

Fast Adc Testing by Repetitive Histogram Analysis

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

Fast Adc Testing by Repetitive Histogram Analysis

Links Úteis

Ajuda