Depth Profiling and Diffusion of 22Ne Implanted in Tantalum by (P, Γ) Resonance Broadening

AuthID
 P-00F-HX1
4
Author(s)
Da Silva, MF
·
Melo, AA
·
Freitag, K
·
Tipo de Documento
Article
Year published
1983
Publicado
in Nuclear Instruments and Methods In Physics Research, ISSN: 0167-5087
Volume: 209-210, Número: PART 2, Páginas: 889-893
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-48749146988
Source Identifiers
ISSN: 0167-5087
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