Advances in Electron Emission Channeling Measurements in Semiconductors

AuthID
 P-00F-K39
1
Author(s)
Tipo de Documento
Article
Year published
2000
Publicado
in HYPERFINE INTERACTIONS, ISSN: 0304-3843
Volume: 129, Número: 1-4, Páginas: 349-370 (22)
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Publication Identifiers
SCOPUS: 2-s2.0-0034455232
Wos: WOS:000165430500024
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ISSN: 0304-3843
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