Electronic Properties of Doped Silicon Nanocrystal Films

AuthID
 P-00F-KER
9
Author(s)
Lechner, R
·
Stegner, AR
·
Dietmueller, R
·
Brandt, MS
·
Ebbers, A
·
Trocha, M
·
Wiggers, H
·
Stutzmann, M
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 104, Número: 5, Páginas: 053701 (7)
Indexing
Wos®
Scopus®
Crossref®73
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-51849130350
Wos: WOS:000259853600055
Source Identifiers
ISSN: 0021-8979
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service