Impurity Lattice Location and Recovery of Structural Defects in Semiconductors Studied by Emission Channeling

AuthID
 P-00F-KWK
3
Author(s)
HOFSAS, H
·
JAHN, SG
Tipo de Documento
Article
Year published
1994
Publicado
in HYPERFINE INTERACTIONS, ISSN: 0304-3843
Volume: 84, Número: 1-4, Páginas: 27-41 (15)
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Publication Identifiers
SCOPUS: 2-s2.0-0005272192
Wos: WOS:A1994NQ66000005
Source Identifiers
ISSN: 0304-3843
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