In Situ Ellipsometric Study of Amorphous Silicon/Amorphous Silicon-Carbon Interfaces

AuthID
 P-00F-M5P
3
Author(s)
Fang, M
·
Drevillon, B
Tipo de Documento
Article
Year published
1991
Publicado
in Journal of Applied Physics, ISSN: 0021-8979
Volume: 69, Número: 5, Páginas: 3363-3365
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Publication Identifiers
SCOPUS: 2-s2.0-0008759407
Source Identifiers
ISSN: 0021-8979
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