in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 520, Páginas: 130-134
Conference
International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense Vii)., Location: Cambridge, MA, Engl, Patrocinadores: SPIE, Bellingham, WA, USA;DOE, Washington, DC, USA;DOE, Office of Industrial Programs, Washington, DC, USA;NBS, Washington, DC, USA;Oak Ridge Natl Lab, Oak Ridge, TN, USA;US Army Cold Regions Research & Engineering Lab, Hanover, NH,
