Calculation And Measurement Of Surface Photovoltage In Thin Film Back-To-Back Surface Barrier Structures In A-Si:h.

AuthID
 P-00F-MJF
5
Author(s)
Chiang, CL
·
Quinlan, S
·
Wagner, S
Tipo de Documento
Proceedings Paper
Year published
1985
Publicado
in Conference Record of the IEEE Photovoltaic Specialists Conference, ISSN: 0160-8371
Páginas: 1290-1294
Conference
Conference Record of the Eighteenth Ieee Photovoltaic Specialists Conference - 1985., Location: Las Vegas, NV, USA, Patrocinadores: IEEE, New York, NY, USA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0022315547
Source Identifiers
ISSN: 0160-8371
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