Efficient and Robust Test Generation-Based Timing Analysis

AuthID
 P-00F-N8H
2
Author(s)
Sakallah Karem, A
Tipo de Documento
Proceedings Paper
Year published
1994
Publicado
in Proceedings - IEEE International Symposium on Circuits and Systems, ISSN: 0271-4310
Volume: 1, Páginas: 303-306
Conference
Proceedings of the 1994 Ieee International Symposium on Circuits and Systems. Part 3 (Of 6), Date: 30 May 1994 through 2 June 1994, Location: London, England
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0028572680
Source Identifiers
ISSN: 0271-4310
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