in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 3784, Páginas: 393-400
Conference
Proceedings of the 1999 Rough Surface Scattering and Contamination, Date: 21 July 1999 through 23 July 1999, Location: Denver, CO, USA, Patrocinadores: SPIE
