Evaluation of Substrate Noise in Cmos and Low-Noise Logic Cells

AuthID
 P-00F-PHD
2
Author(s)
1
Editor(es)
Tritt T.M.Nolas G.S.Mahan G.D.Mandrus D.
Tipo de Documento
Proceedings Paper
Year published
2001
Publicado
in Materials Research Society Symposium - Proceedings, ISSN: 0272-9172
Volume: 626, Páginas: IV750-IV753
Conference
Thermoelectric Materials 2000-The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications, Date: 24 April 2000 through 27 April 2000, Location: San Francisco, CA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0035026295
Source Identifiers
ISSN: 0272-9172
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service