Dependence of Scattered Ion Yield on the Incident Energy:: Ne+ on Pure Gallium and Indium

AuthID
P-00F-Q8Z
4
Author(s)
Daolio, S
·
Pagura, C
·
Greenwood, CL
Tipo de Documento
Article
Year published
2003
Publicado
in SURFACE SCIENCE, ISSN: 0039-6028
Volume: 531, Número: 2, Páginas: 95-102 (8)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0038558141
Wos: WOS:000182900500003
Source Identifiers
ISSN: 0039-6028
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