Publicações

Hard X-Ray Polarimetry with a Thick Cdte Position Sensitive Spectrometer

AuthID
P-00F-QFR

Author(s)

Caroli, E

Bertuccio, G

Cola, A

Curado da Silva, RM

Donati, A

Dusi, W

Landini, G

Siffert, P

Sampietro, M

Stephen, JB

Tipo de Documento

Proceedings Paper

Year published

2000

Publicado

in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X

Volume: 4140, Páginas: 573-583

Conference

X-Ray and Gamma-Ray Instrumentation for Astronomy Xi, Date: 2 August 2000 through 4 August 2000, Location: San Diego, CA,USA, Patrocinadores: SPIE-The International Society for Optical Engineering

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Fontes

Publication Identifiers

DOI: 10.1117/12.409157

SCOPUS: 2-s2.0-0142181437

Source Identifiers

ISSN: 0277-786X

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Hard X-Ray Polarimetry with a Thick Cdte Position Sensitive Spectrometer

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Hard X-Ray Polarimetry with a Thick Cdte Position Sensitive Spectrometer

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