Simultaneous Measurements of Small Angle X-Ray Scattering, Wide Angle X-Ray Scattering, and Dielectric Spectroscopy During Crystallization of Polymers

AuthID
 P-00F-QNB
7
Author(s)
Sics, I
·
Nogales, A
·
Ezquerra, TA
·
Balta Calleja, FJ
·
Meyer, A
·
Dohrmann, R
Tipo de Documento
Article
Year published
2000
Publicado
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 71, Número: 4, Páginas: 1733-1736 (4)
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0348137164
Wos: WOS:000086296600028
Source Identifiers
ISSN: 0034-6748
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