Light and Current Degradation of A-Si:h Pin, Nin and Pip Diodes Detected with Cpm

AuthID
 P-00F-QRN
4
Author(s)
Ostendorf, HC
·
Kusian, W
·
Kruhler, W
·
Tipo de Documento
Article
Year published
1993
Publicado
in Journal of Non-Crystalline Solids, ISSN: 0022-3093
Volume: 164-166, Número: PART 2, Páginas: 659-662
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-11744292482
Source Identifiers
ISSN: 0022-3093
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