Determination of Subgap-Absorption in Μc-Si:h Films by Cpm

AuthID
 P-00F-R1H
7
Author(s)
Krankenhagen, R
·
Schmidt, M
·
Henrion, W
·
Sieber, I
·
Koynov, S
·
Grebner, S
·
Tipo de Documento
Article
Year published
1996
Publicado
in Diffusion and Defect Data Pt.B: Solid State Phenomena, ISSN: 1012-0394
Volume: 47-48, Páginas: 607-612
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-17544372865
Source Identifiers
ISSN: 1012-0394
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