Publicações

Exafs Characterization of Nickel Clusters in Ni/Si3N4 Sputtered Thin Films

AuthID
P-00F-RRE

Author(s)

Vila, M

Jimenez Villacorta, F

Prieto, C

Traverse, A

Tipo de Documento

Article

Year published

2005

Publicado

in Physica Scripta T, ISSN: 0281-1847

Volume: T115, Páginas: 454-456

Conference

12Th X-Ray Absorption Fine Structure International Conference, Xafs12, Date: 23 June 2003 through 27 June 2003, Location: Malmo, Patrocinadores: Royal Swedish Academy of Sciences, Nobel Institute for Physics;Swedish Foundation for Strategic Research;Crafoord Foundation;University of Lund;Swedish Research Council

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