Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current Measurements

AuthID
 P-00F-SD7
5
Author(s)
Bardi, U
·
Chenakin, SP
·
Lavacchi, A
·
Pagura, C
·
Tipo de Documento
Article
Year published
2006
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 252, Número: 20, Páginas: 7373-7382 (10)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-33747166760
Wos: WOS:000240478100009
Source Identifiers
ISSN: 0169-4332
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service