Temperature Dependence of Leakage Current in Segmented A-Si:h N-I-P Photodiodes

AuthID
 P-00F-TY4
8
Author(s)
Jeff, HC
·
Tsu, CC
·
Striakhilev, D
·
Kyung, HK
·
Nathan, A
·
Heiler, G
·
Tredwell, T
Tipo de Documento
Proceedings Paper
Year published
2007
Publicado
in Materials Research Society Symposium Proceedings, ISSN: 0272-9172
Volume: 989, Páginas: 475-480
Conference
2007 Mrs Spring Meeting, Date: 9 April 2007 through 13 April 2007, Location: San Francisco, CA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-41549115577
Source Identifiers
ISSN: 0272-9172
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