Measurement of Surface Photovoltage in High-Rate Deposited A-Si:h Films and Comparison with Photothermal Deflection Spectroscopy and Conductivity Data

AuthID
 P-00F-V51
6
Author(s)
Goedecker, S
·
Muschik, T
·
Shah, AV
·
Curtins, H
Tipo de Documento
Article
Year published
1987
Publicado
in Journal of Non-Crystalline Solids, ISSN: 0022-3093
Volume: 97-98, Número: PART 1, Páginas: 759-762
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-45949113209
Source Identifiers
ISSN: 0022-3093
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