Depth Profiling Using Secondary Ion Mass Spectrometry and Sample Current Measurements

AuthID
 P-00F-V9A
3
Author(s)
Bardi, U
·
Chenakin, SP
Tipo de Documento
Article
Year published
2007
Publicado
in JOURNAL OF SURFACE INVESTIGATION, ISSN: 1027-4510
Volume: 1, Número: 6, Páginas: 734-740 (7)
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Publication Identifiers
SCOPUS: 2-s2.0-49249136320
Wos: WOS:000205679500019
Source Identifiers
ISSN: 1027-4510
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