Study of Pecvd Silicon Nitride and Silicon Oxide Gate Dielectrics for Organic Thin-Film Transistor Circuit Integration

AuthID
 P-00F-W1S
5
Author(s)
Li, FM
·
Wu, Y
·
Ong, BS
·
Nathan, A
Tipo de Documento
Proceedings Paper
Year published
2007
Publicado
in Materials Research Society Symposium Proceedings, ISSN: 0272-9172
Volume: 1003, Páginas: 124-129
Conference
Organic Thin-Film Electronics- Materials, Processes, and Applications - 2007 Mrs Spring Meeting, Date: 9 April 2007 through 13 April 2007, Location: San Francisco, CA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-70349912293
Source Identifiers
ISSN: 0272-9172
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