Publicações

Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling

AuthID
P-00F-W5W

Author(s)

Pantelides, ST

Tsetseris, L

Beck, MJ

Rashkeev, SN

Hadjisavvas, G

Batyrev, IG

Tuttle, BR

Marinopoulos, AG

Zhou, XJ

Fleetwood, DM

Schrimpf, RD

Tipo de Documento

Proceedings Paper

Year published

2009

Publicado

in ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference

Páginas: 76-83

Conference

35Th European Solid-State Circuits Conference, Esscirc 2009, Date: 14 September 2009 through 18 September 2009, Location: Athens, Patrocinadores: National and Kapodistrian University of Athens;Raith - Innovative Solutions for Nanofabrication and;Semiconductor Navigation;NXP;HellenicSIA

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