Seeing Inside Materials by Aberration-Corrected Electron Microscopy

AuthID
 P-00F-X8T
8
Author(s)
Pennycook, SJ
·
Van Benthem, K
·
Oh, SH
·
Molina, SI
·
Borisevich, AY
·
Luo, W
·
Pantelides, ST
Tipo de Documento
Article
Year published
2011
Publicado
in International Journal of Nanotechnology, ISSN: 1475-7435
Volume: 8, Número: 10-12, Páginas: 935-947
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-84857201880
Source Identifiers
ISSN: 1475-7435
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