in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2 in IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS, ISSN: 1091-5281
Páginas: 707-710 (4)
Conference
20Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 20-22, 2003, Location: VAIL, CO, Patrocinadores: IEEE Instrumentat & Measurement Soc
